Cross-conduction detector for switching regulator

ABSTRACT

An integrated circuit includes a detector configured to monitor a high-drive signal and a low-drive signal that drives a high-side switch and a low-side switch respectively of an integrated circuit switching regulator. The detector monitors both the rising edge and the trailing edge of each of the high-drive and the low-drive signals respectively to determine a timing overlap between the signals and generates a detection signal indicating a dead-time value proportional to the presence or absence of the timing overlap between the signals. An output circuit can be configured to process the detection signal from the detector to enable a correction of the timing overlap between the signals if timing overlap is detected.

TECHNICAL FIELD

This disclosure relates to power supply circuits, and more particularlyto synchronous switching regulator integrated circuits.

BACKGROUND

Cross-conduction in switching regulators occurs when a high-side switch(connected to the input of a power supply) and low-side switch(connected to ground) are turned on at the same time, thereby creating ashort circuit from the input supply to ground. This can lead to largecurrent spikes and voltage transients that can degrade the reliabilityof the switches and decrease performance of precision circuits.Cross-conduction can be avoided by ensuring that the signal that turnson the high-side switch (HDRV) is not high at the same time as thesignal that turns on the low-side switch (LDRV). In other words, anon-overlap or “dead-time” between the HDRV and LDRV signals should beprovided by circuit design principles and tolerances. One issue withdesign tolerances is that to ensure there is no signal overlap, moredead-time may be selected than required, which can result in decreasedefficiency of the switching regulator. Automated testing systems can beemployed to measure the HDRV and LDRV signals to determine if anyoverlap exists while testing for a minimum of dead-time to promoteefficiency.

There are two instances when cross-conduction can occur because ofsignal overlap. In one instance, overlap can occur when the LDRV signalis rising high (low-side switch is turning on) and HDRV is falling low(high-side switch is turning off). The other overlap case is when theHDRV signal is rising high and the LDRV is falling low. Unfortunately,for switching regulator integrated circuits (ICs) having integratedswitches, the HDRV and LDRV signals are internal to the chip and thusnot readily observable by test equipment to ensure that they do notoverlap. An obvious solution is to route the drive signals external tothe IC for testing but such strategy can increase costs of the IC byadding extra pins and also introduce noise in the system.

SUMMARY

This disclosure relates to timing detection and controls for switchingregulator integrated circuits. In one example, an integrated circuitincludes a detector to monitor a high-drive signal and a low-drivesignal that drives a high-side switch and a low-side switch,respectively, of a switching regulator that is part of the integratedcircuit. The detector monitors both the rising edge and the trailingedge of each of the high-drive and the low-drive signals, respectively,to determine a timing overlap between the signals and generates adetection signal having a value proportional to the presence or absenceof the timing overlap between the high-drive and the low-drive signals.An output circuit processes the detection signal from the detector toprovide an output characterizing at least one of a dead-time orcross-conduction of the switching regulator.

In another example, an integrated circuit includes a detector monitors ahigh-drive signal and a low-drive signal that drives a high-side switchand a low-side switch respectively of an integrated circuit switchingregulator. The detector monitors both the rising edge and the trailingedge of each of the high-drive and the low-drive signals respectively todetermine a timing overlap between the signals and generates a detectionsignal indicating a dead-time value proportional to the presence orabsence of the timing overlap between the signals. An output circuitprocesses the detection signal from the detector to enable a correctionof the timing overlap between the signals if timing overlap is detected.A pulse width modulated signal is monitored by the detector with thehigh-drive and low-drive signals to clock the detection signal. Thedetector generates the detection signal as clocked signal pulses havinga pulse-width that is proportional to the dead-time value if no timingoverlap is detected and generates no signal pulses for the detectionsignal if the timing overlap is detected.

In yet another example, an integrated circuit includes a detectorconfigured to monitor a high-drive signal and a low-drive signal thatdrives a high-side switch and a low-side switch respectively of anintegrated circuit switching regulator. The detector monitors both therising edge and the trailing edge of each of the high-drive and thelow-drive signals respectively to determine a timing overlap between thesignals and generates a detection signal indicating a dead-time valueproportional to the presence or absence of the timing overlap betweenthe signals. An output circuit processes the detection signal from thedetector to enable a correction of the timing overlap between thesignals if timing overlap is detected. An internal circuit receives thedetection signal from the output circuit to automatically adjust thedead-time value if the timing overlap is detected.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an example of an integrated circuit switchingregulator.

FIG. 2 illustrates an example detector for an integrated circuitswitching regulator.

FIG. 3 illustrates an example timing diagram for the example detectorillustrated in FIG. 2.

FIG. 4 illustrates another example of a detector and output circuit.

FIG. 5 illustrates yet another example detector and output circuit.

FIG. 6 illustrates still another example detector and output circuithaving an amplified reporting output for an integrated circuit switchingregulator.

FIG. 7 illustrates an example detector and output circuit having anamplified reporting output that is captured by a register for anintegrated circuit switching regulator.

FIG. 8 illustrates a detector and output circuit that generates anautomatic dead-time correction signal for an integrated circuitswitching regulator.

DETAILED DESCRIPTION

An integrated circuit is provided for efficient operation of asynchronous switching regulator. Drive signals which control how currentis switched in an output inductor of the synchronous switching regulatorare monitored internally by the integrated circuit via a detector. Thedetector determines the presence or absence of dead-time and/or crossconduction between the drive signals and generates a detection signalindicating whether or not a timing overlap between the signals exists.Rather than merely routing the drive signals external to the integratedcircuit for processing which can generate noise and increase the cost ofthe integrated circuit by increasing pin count, the detection signal isprocessed internally by an output circuit which can report timingoverlap (or lack thereof) between the drive signals and/or initiateautomatic timing correction within the integrated circuit, if necessary.

FIG. 1 illustrates a circuit 100 that includes a detector 104 and outputcircuit 108 for an integrated circuit switching regulator 110. Thecircuit 100 can be implemented according to various configurations fordetecting dead-time and/or cross-conduction of regulator switches 120and 124. In some examples, the circuit can be configured withoutrequiring routing such signals externally for additional testing and/oradjustment of dead-time or cross-conduction. For example, the circuitcan be configured to monitor multiple internal signals for dead-timeand/or cross-conduction, based on such monitoring, the circuit cangenerate a single signal (e.g., at an integrated circuit pin) from suchmonitoring to reduce pin-count of the switching regulator 110 whichindicates the presence or absence of dead-time. As disclosed herein,various configurations can be provided for monitoring the single signaland for adjusting dead-time in the switching regulator if necessary.

The detector 104 can be configured to monitor a high-drive signal and alow-drive signal that drive a high-side switch 120 and a low-side switch124, respectively, of the integrated circuit switching regulator 110.The detector 104 can monitor both the rising edge and the trailing edgeof each of the high-drive and the low-drive signals respectively todetermine a timing overlap between the signals. The detector 104 cangenerate a detection signal 130 indicative of the timing overlap orabsence thereof. For example, the detection signal 130 can be a singlesignal representing a dead-time and/or cross-conduction. For example,the output signal can provide a value, corresponding to a pulse width ofthe detection signal 130, that is proportional to the presence orabsence of the timing overlap between the signals (e.g., indicatingdead-time or cross-conduction).

By way of example, if timing overlap between the high and low-drivesignals is detected by the detector 104, then inadequate dead-time orcross-conduction can be determined to be present, whereas if no timingoverlap is detected, then suitable dead-time or lack of cross-conductionmay be determined. For example, a DC value detected at about 50% ofsupply voltage indicates no overlap or cross-conduction and a DC valuedetected at about the supply voltage or near ground indicates a timingoverlap. As shown, a pulse width modulated (PWM) signal can be providedto the output circuit 108 to clock the detection signal 130. Thedetector 104 thus can generate the detection signal 130 as signalpulses, which are clocked by the PWM signal and having a pulse-widththat is proportional to the dead-time value or cross-conduction based onthe presence or absence of overlap between the high- and low-drivesignals.

Output from the high-side switch 120 and low-side switch 124 drives anoutput inductor 140 to generate a DC voltage. Each switch should be onat different times to avoid cross-conduction in the switches (e.g., whenboth switches are on at the same time cross-conduction between switchescan occur). Ideally, the high-side switch 120 and the low-side switch124 are controlled to turn on via the high-drive and the low-drivesignals such that the switches are not conducting at the same time yetnot leaving either switch in the off state for too long to promoteefficiency in the switching regulator 110.

As shown, a drive circuit 160 generates the high-drive signal and thelow-drive signal, respectively. The drive circuit 160 can receive inputs(e.g., digital register value) to alter the timing of the drive signalsand ultimately the timing of the high-side switch 120 and the low-sideswitch 124. For example, in an automated test environment, if inadequatedead-time were detected via an output 150 from the output circuit 108, aregister value could be altered inside the drive circuit 160 to changethe timing between the drive signals incrementally (e.g., 5 nanosecondincrements). In another example, the output 150 could be fed-back to thedrive circuit 160 or other control circuitry to implement automatictiming adjustment for the high and low-drive signals (See FIG. 7).

The output circuit 108 can be configured to provide an output indicativeof dead-time or cross-conduction based on the detection signal 130 fromthe detector 104. In some examples, the signal provided by the outputcircuit can be processed to enable a correction of the timing overlapbetween the signals to mitigate dead-time and cross-conduction. Suchtiming correction can be provided by external circuitry or by one ormore possible configurations of the output circuit 108, such as theexample output circuits illustrated and described below with respect toFIGS. 4-7. For example, configurations can include monitoring the output150 from the output circuit 108 via external equipment (e.g., automatedtest equipment (ATE)) and initiating a timing adjustment via a registeradjustment (e.g., changing a register digital value) in the switchingregulator 110, for example.

In other examples, timing correction can be provided via internalmonitoring and adjustments within the switching regulator 110 withoutexternal monitoring. In either configuration, pin count of the switchingregulator 110 can be reduced since in one configuration only a singlepin is employed to monitor the output(s) 150 or, in the internalconfiguration, no pins are utilized as the output 150 can be processedinternally to the IC switching regulator 110. Thus, rather than routeboth the high-drive and the low-drive signals externally for monitoringas for conventional circuits, one or less (i.e., zero) pins can beemployed in the switching regulator 110 since the detector 104 onlygenerates the detection signal 130 from the logic employed formonitoring multiple drive signals.

The detector 104 and output circuit 108 cooperate to detectcross-conduction or dead-time for switches 120 and 124 of the ICswitching regulator 110 without the need to monitor the high-drive andlow-drive signals via an ATE, for example. The circuit 100 can also bemodified, such as disclosed herein, to measure dead-time withoutobserving the high-drive and low-drive signals externally. The absenceof cross-conduction in switching regulator ICs with integrated switchesmanifests itself by periodic voltage transitions to (approximately) −1Von the node common to the high- and low-side switch, commonly referredto as the SW node and shown as SW driving the inductor 140. Thesetransitions should be monitored to ensure adequate dead-time. In otherexamples, since regulators with integrated switches do not providenatural access to the voltage signals that turn on the high-side(high-drive) and low-side (low-drive) switches 120 and 124, thesesignals could be routed to pins in a test-mode and monitored foroverlap.

The circuit 100 detects the presence of cross-conduction or dead-timewithout the need to monitor potentially noisy SW, low-drive, andhigh-drive signals external to the IC switching regulator 110. Thedetector 104 and output circuit 108 minimize the need to detectcross-conduction by monitoring the SW node for periodic −1V transitions,for example. Detecting these voltage transients can be difficult in theproduction test environment because of undesired parasitic elementsinherent to the test equipment. Thus, the large transient voltage dropsacross these parasitic elements that occur when the IC switchingregulator 110 is operational can overwhelm the −1V voltage on the SWnode, making it difficult to detect. By utilizing the detector 104 andoutput circuit 108, routing the high-drive signal and low-drive signalto an external pin becomes unnecessary. The high-drive and low-drivesignals are switching signals that have the potential of coupling noiseonto other noise-sensitive signals and potentially corrupting them.Therefore, routing these noisy signals in the layout of large, complexICs to an external pin can entail significant risk, and the circuit 100mitigates such risk.

The circuit 100 can be scaled to include an indirect, noise-immunemeasurement of dead-time or cross-conduction without requiring tomeasure it directly at the SW node in a noisy environment that does notyield reliable results. The circuit 100 can also be scaled to eliminatethe need to measure dead-time on an ATE, thereby reducing test-time andtest costs.

In one example, the circuit 100 can be provided as a circuit (e.g.,integrated circuit, discrete circuit, combination of integrated circuitand discrete circuits) for generating a switched DC voltage via theinductor 140. Discrete control elements can be provided within the drivecircuit 160, for example, for adjusting dead-time. This could include aprocessor operating firmware to control operation of the drive circuit160. In another example, the drive circuit 160 could be a hard-wiredfunction wherein dedicated logic and switching elements control thedrive circuit 160. In yet another example, a combination of programmedelements and circuit logic elements could cooperate to perform theoperation of the drive circuit 160.

It is noted that the examples described herein can be provided viadifferent analog and/or digital circuit implementations. For instance,in some cases, field effect transistors can be employed and in othercases junction transistors or diodes employed. Some components can beemployed as discrete implementations such as a comparator comparing areference signal to a control signal and in other examples, controllersoperating via processor instructions and exchanging data via D/A and A/Dconverters could be employed to monitor drive signals and generatetiming adjustment signals within the switching regulator 110. Thecircuit 100 can employ various means of monitoring electrical parameterssuch as monitoring voltage and/or current via the detector 104. It canalso employ a microcontroller or other control circuitry capable ofdigitizing these parameters, storing digital interpretations of theseparameters in its memory, and associating acquired values with events inthe circuit 100 operation. This includes performing logical andarithmetical operations with the acquired values, for example.

FIG. 2 illustrates an example detector 200 for an integrated circuitswitching regulator. The detector 200 monitors a high-drive signal andlow-drive signal via gates 220 (e.g., EXCLUSIVE OR gate) and 224 (e.g.,NAND gate). Output from gate 220 is inverted via gate 230 (e.g.,inverter) which feeds gate 240 (e.g., AND gate). Output from gate 224drives the other leg of gate 240. Output from gate 240 along with a PWMsignal drive gate 250 (e.g., AND gate) which generates the detectionsignal described above with respect to FIG. 1 and illustrated asLH-PULSE. It is noted that in addition or as an alternative to theapproach depicted in FIG. 2, a similarly configured circuit could beemployed using an inverted version of the PWM signal to detect dead-timebetween the falling edge of high-drive and the rising edge low-drive,for example.

An example of timing for the high-drive signal, low-drive signal, PWMsignal, and resultant LH-PULSE output in the detector 200 are shown inthe timing diagram 310 of FIG. 3. If the low-drive and high-drivesignals do not overlap, e.g., there is no cross-conduction, the detector200 of FIG. 2 will generate a series of pulses at the LH-PULSE node thatare as wide as the dead-time between falling edge of low-drive and therising edge of high-drive (TDEAD) and have a period the same as the PWMswitching period (TPERIOD). The switching LH-PULSE signal is thenutilized as the drive signal for the subsequent output correctionconfigurations which are disclosed herein with respect to FIGS. 4-8. Inanother example, an HL-Pulse can also be generated wherecross-conduction or dead-time is detected on opposite edges of thehigh-drive and low-drive signals, respectively. Such HL-Pulse could bedetected at the output of the and gate 240 of FIG. 2, for example. In anexample implementation, both the LH-Pulse and the HL-Pulse are monitoredas described herein.

FIG. 4 illustrates an example detector 400 and output circuit 410 havinga single filtered reporting output 420 for an integrated circuitswitching regulator. In this example, the LH-PULSE signal from thedetector 400 can be processed to either detect the presence ofcross-conduction or, if required, measure the dead-time (to quantify theabsence of cross-conduction). As shown in the example of FIG. 4, theLH-PULSE signal can be converted to a 50% duty cycle square wave,(timing shown at diagram 424) as output LH-50PC, through a flip-flop430. This square wave can be subsequently averaged by an on-chip filter440 to generate a quiet, filtered signal, LH-50PC-FILT, with a DC valueof half the logic supply voltage (VDD/2), for example. The instance whenthe signal LH-50PC-FILT can have a zero value or can be pulled to VDD isif the DETECT-LH signal is not switching which, in turn, implies anoverlap of the high-drive and low-drive signal and, therefore,cross-conduction has occurred. Thus, monitoring the signal LH-50PC-FILTfor a non-zero, non-VDD value detects the absence of cross-conduction.This signal representing cross-conduction (or dead-time) can bemonitored easily by an external ATE or internal circuitry, for example.

FIG. 5 illustrates an example detector 500 and output circuit 510 havinga single filtered reporting output 520 that is captured by (e.g., storedin memory) a register 530 of an integrated circuit switching regulator.In this example, the output circuit 310 depicted above can be extendedto implement a Built-In-Self-Test (BIST) circuit, and thus eliminatingthe need for testing this parameter on an external ATE, for example. Anintegrated comparator 540 (e.g., window comparator, single thresholdcomparator) can compare the LH-50PC-FILT signal to a reference voltage(VREF) to determine the presence of adequate dead-time and store theresult in memory such as the on-chip register 530. For example, a logic‘1’ in the register 530 implies the presence of dead-time, while logic‘0’ implies cross-conduction. Associated on-chip circuitry (e.g., in thedriver circuit 160) can be configured to adjust relative timing for thedrive signals based on the value stored in the register 530, such as viathe drive circuit disclosed with respect to FIG. 1. In one example, aproduction operator could set the register value manually to adjust thetiming. In another example, the register value could be employed asfeedback to adjust the drive circuit timing automatically as disclosedwith respect to FIG. 8.

FIG. 6 illustrates an example detector 600 and output circuit 610 havingan amplified reporting output 620 for an integrated circuit switchingregulator. In this example, the LH-PULSE signal from the detector 600can be employed to quantify the absence of cross-conduction, e.g.,measure the dead-time. This can be implemented, for example, byfiltering the LH-PULSE signal directly by an on-chip filter 630. Theoutput of the filter 630 can provide a DC voltage, LH-FILT, which isproportional to the width of the pulses of the LH-PULSE signal which, inturn, is proportional to the “dead-time.” The value of this signal isTDEAD/TPERIOD. This signal can be amplified by an amplifier 640 withgain A (LH-FILT-AMP). The amplified signal can be exposed via a pin andcan be measured by an ATE which can subsequently calculate the dead-timeby determining TPERIOD. For instance, the TPERIOD can be measuredefficiently through the SW node described above, for example.

FIG. 7 illustrates an example circuit implementing a detector 700 andoutput circuit 710. The output circuit 710 provides an amplifiedreporting output 720 that is captured by a register 730 for anintegrated circuit switching regulator. As an example, the outputcircuit 610 disclosed with respect to FIG. 6 can be extended to providea Built-In-Self-Test (BIST) integrated into the circuit 700 of FIG. 7.By integrating the BIST in the circuit 700, the need for testing thisparameter using an external ATE, for example, can be eliminated. In theexample of FIG. 7, the amplified signal, LH-FILT-AMP, at 720 is fed toan analog-to-digital converter (ADC) 740. The ADC converts the analogoutput to a corresponding digital representation whose output is storedin a register bank 730, thereby storing a digital value representing oneor more of dead-time or cross-conduction. The stored digital value cansubsequently be transmitted externally (or internally for automatedcorrection) via a number of communication protocols (e.g., PMBus, I²C,and so forth).

FIG. 8 illustrates an example of an integrated circuit 800 having adetector 804 and output circuit 808 configured to generate a correctionsignal for an integrated circuit switching regulator 810. For example,the correction signal can be utilized to correct one of a detecteddead-time or cross-conduction for the switching regulator. Similar tothe circuit 100 described above with respect to FIG. 1, the detector 804can be configured to monitor a high-drive signal and a low-drive signalthat drive a high-side switch 820 and a low-side switch 824 respectivelyof the integrated circuit switching regulator 810. For instance, thedetector 804 monitors both the rising edge and the trailing edge of eachof the high-drive and the low-drive signals respectively to determine atiming overlap between the signals and to generate a detection signal830 indicating the presence or absence of the timing overlap between thesignals (e.g., pulse width of signal indicating value of dead-time). Toenable the detection of overlap between the high-drive and low-drivesignals, for example, a PWM signal, which is provided for drivingrespective switches, can be provided to the detector 804 along with thehigh-drive and low-drive signals to clock the detection signal 830. Iftiming overlap between the high and low-drive signals is detected by thedetector 804, then inadequate dead-time can be determined to be present,whereas if no timing overlap is detected, then suitable dead-time may bedetermined. As an example, the detector 804 can generate the detectionsignal 830 as clocked signal pulses having a pulse-width that isproportional to the dead-time value if no timing overlap is detected andthe PWM signal is logic ‘1’, and generates no signal pulses for theoutput signal if the timing overlap is detected, for example. In otherexamples, the detector 804 can be configured provide the detectionsignal 830 with a pulse width proportional to cross-conduction whenoverlap is detected when gated by the PWM signal. The output circuit 808and internal correction circuit 870 can also be implemented as a counterthat decreases the dead-time by a fixed amount (e.g., step) each time adead-time pulse is detected. For example, if no pulse is detected thecounter can increment and move the dead-time back until pulses arederived.

Output from the high-side switch 820 and low-side switch 824 drives anoutput inductor 840 to generate a DC voltage. Each switch should be onat different times to avoid cross-conduction in the switches (e.g., whenboth switches are on at the same time cross-conduction between switchescan occur). Ideally, the high-side switch 820 and the low-side switch824 are timed to turn on via the high-drive and the low-drive signalssuch that the switches are not conducting at the same time yet notleaving either switch in the off state for too long to promoteefficiency in the switching regulator 810.

A drive circuit 860 generates the high-drive signal and the low-drivesignal, respectively, based on the PWM signal that is also provided tothe detector 804. The drive circuit 860 can receive feedback inputs(e.g., digital register value) from an internal circuit 870 to alter thetiming of the drive signals and ultimately the timing of the high-sideswitch 820 and the low-side switch 824. As shown, an automaticcorrection signal from the output circuit 808 is fed-back to theinternal circuit 870 for automatic timing adjustment of the high-driveand low-drive signals via the drive circuit 860. The automaticcorrection signal from the output circuit 808 can be an analog value, adigital value, or a combination of analog/digital values representingthe timing overlap (or lack thereof) between the high-drive andlow-drive signals as detected by the detector 804.

What have been described above are examples. It is, of course, notpossible to describe every conceivable combination of components ormethodologies, but one of ordinary skill in the art will recognize thatmany further combinations and permutations are possible. Accordingly,the disclosure is intended to embrace all such alterations,modifications, and variations that fall within the scope of thisapplication, including the appended claims. As used herein, the term“includes” means includes but not limited to, the term “including” meansincluding but not limited to. The term “based on” means based at leastin part on. Additionally, where the disclosure or claims recite “a,”“an,” “a first,” or “another” element, or the equivalent thereof, itshould be interpreted to include one or more than one such element,neither requiring nor excluding two or more such elements.

1. An integrated circuit comprising: a detector configured to monitor ahigh-drive signal and a low-drive signal that drive a high-side switchand a low-side switch, respectively, of a switching regulator that ispart of the integrated circuit, wherein the detector monitors both arising edge and a trailing edge of each of the high-drive and thelow-drive signals, respectively, to determine a timing overlap betweenthe signals, and to generate a detection signal having a valueproportional to a presence or absence of the timing overlap between thehigh-drive and the low-drive signals; and an output circuit configuredto process the detection signal from the detector to provide an outputcharacterizing at least one of a dead-time or cross-conduction of theswitching regulator and to adjust the timing to control did next time ofa next switching cycle to prevent or reduce cross-conduction of theswitching regulator.
 2. An integrated circuit comprising: a detectorconfigured to monitor a high-drive signal and a low-drive signal thatdrive a high-side switch and a low-side switch, respectively, of aswitching regulator that is part of the integrated circuit, wherein thedetector monitors both a rising edge and a trailing edge of each of thehigh-drive and the low-drive signals, respectively, to determine atiming overlap between the signals, and to generate a detection signalhaving a value proportional to a presence or absence of the timingoverlap between the high-drive and the low-drive signals; and an outputcircuit configured to process the detection signal from the detector toprovide an output characterizing at least one of a dead-time orcross-conduction of the switching regulator; further comprising a pulsewidth modulated signal that is monitored by the detector with thehigh-drive and low-drive signals to clock the detection signal, whereinthe detector generates the detection signal as clocked signal pulseshaving a pulse-width that is proportional to the dead-time if no timingoverlap is detected and generates no signal pulses for the detectionsignal if the timing overlap is detected.
 3. The integrated circuit ofclaim 1, wherein the output circuit further comprises a flip flop thatis clocked from the detection signal of the detector to provide a fiftypercent duty cycle signal representing the timing overlap between thesignals.
 4. The integrated circuit of claim 3, wherein the outputcircuit further comprises a filter that is applied to the fifty percentduty cycle signal to generate a DC voltage signal representing thetiming overlap between the signals, wherein a DC value at about 50% of asupply voltage indicates no overlap or cross-conduction and wherein a DCvalue at about the supply voltage or at about ground indicates thepresence of the timing overlap.
 5. The integrated circuit of claim 4,wherein the output circuit further comprises a comparator that comparesthe DC voltage signal to a predetermined reference signal to generate acomparator output that represents the timing overlap between thesignals.
 6. The integrated circuit of claim 5, wherein the outputcircuit further comprises a register that is clocked from the comparatoroutput, wherein a logic high in the register indicates a presence ofdead-time between the signals and wherein a logic low in the registerindicates the presence of the timing overlap between the high-drive andthe low-drive signals.
 7. The integrated circuit of claim 2, wherein theoutput circuit drives a filter to generate a DC voltage representing thetiming overlap between the signals.
 8. The integrated circuit of claim7, further comprising an amplifier to amplify the DC voltage and providean external DC output voltage to measure the timing overlap between thesignals.
 9. The integrated circuit of claim 8, further comprising ananalog to digital converter (ADC) to convert the external DC outputvoltage to a register value that is communicated externally from theswitching regulator via a communication protocol.
 10. The integratedcircuit of claim 9, wherein the communication protocol includes PMBusprotocol or an I²C protocol.
 11. The integrated circuit of claim 9,wherein the register value is employed by an internal circuit toautomatically adjust the timing overlap between the signals.
 12. Anintegrated circuit comprising: a detector configured to monitor ahigh-drive signal and a low-drive signal that drive a high-side switchand a low-side switch respectively of an integrated circuit switchingregulator, wherein the detector monitors both a rising edge and atrailing edge of each of the high-drive and the low-drive signals,respectively, to determine a timing overlap between the signals, and togenerate a detection signal indicating a dead-time value proportional toa presence or absence of the timing overlap between the signals; and anoutput circuit configured to process the detection signal from thedetector to enable a correction of the timing overlap between thesignals if timing overlap is detected, wherein a pulse width modulatedsignal is monitored by the detector with the high-drive and low-drivesignals to clock the detection signal, wherein the detector generatesthe detection signal as clocked signal pulses having a pulse-width thatis proportional to the dead-time value if no timing overlap is detectedand generates no signal pulses for the detection signal if the timingoverlap is detected.
 13. The integrated circuit of claim 12, wherein theoutput circuit further comprises a flip flop that is clocked from thedetection signal of the detector to provide a fifty percent duty cyclesignal representing the timing overlap between the signals.
 14. Theintegrated circuit of claim 13, wherein the output circuit furthercomprises a filter that is applied to the fifty percent duty cyclesignal to generate a DC voltage signal representing the timing overlapbetween the signals, wherein a DC value at about 50% of a supply voltageindicates no overlap or cross-conduction and a DC value at about thesupply voltage or at about ground indicates a timing overlap.
 15. Theintegrated circuit of claim 14, wherein the output circuit furthercomprises a comparator that compares the DC voltage signal to apredetermined reference signal to generate a comparator output thatrepresents the timing overlap between the signals.
 16. The integratedcircuit of claim 15, wherein the output circuit further comprises aregister that is clocked from the comparator output, wherein a logichigh in the register indicates a presence of dead-time between thesignals and wherein a logic low in the register indicates the presenceof the timing overlap between the signals.
 17. The integrated circuit ofclaim 12, wherein the output circuit generates an amplified DC outputvoltage representing the timing overlap between the signals.
 18. Theintegrated circuit of claim 17, further comprising an analog to digitalconverter (ADC) to convert the amplified DC output voltage to a registervalue that is communicated externally from the integrated circuitswitching regulator via a communication protocol.
 19. An integratedcircuit comprising: a detector configured to monitor a high-drive signaland a low-drive signal that drive a high-side switch and a low-sideswitch respectively of an integrated circuit switching regulator,wherein the detector monitors both a rising edge and a trailing edge ofeach of the high-drive and the low-drive signals respectively todetermine a timing overlap between the signals, and to generate adetection signal indicating a dead-time value proportional to a presenceor absence of the timing overlap between the signals; an output circuitconfigured to process the detection signal from the detector to enable acorrection of the timing overlap between the signals if timing overlapis detected; and an internal circuit that receives the detection signalfrom the output circuit to automatically adjust the dead-time value ifthe timing overlap is detected and to adjust the timing to control didnext time of a next switching cycle to prevent or reducecross-conduction of the switching regulator.
 20. An integrated circuitcomprising: a detector configured to monitor a high-drive signal and alow-drive signal that drive a high-side switch and a low-side switchrespectively of an integrated circuit switching regulator, wherein thedetector monitors both a rising edge and a trailing edge of each of thehigh-drive and the low-drive signals respectively to determine a timingoverlap between the signals, and to generate a detection signalindicating a dead-time value proportional to a presence or absence ofthe timing overlap between the signals; an output circuit configured toprocess the detection signal from the detector to enable a correction ofthe timing overlap between the signals if timing overlap is detected;and an internal circuit that receives the detection signal from theoutput circuit to automatically adjust the dead-time value if the timingoverlap is detected; further comprising a pulse width modulated signalthat is monitored by the detector with the high-drive and low-drivesignals to clock the detection signal, wherein the detector generatesthe detection signal as clocked signal pulses having a pulse-width thatis proportional to the dead-time value if no timing overlap is detectedand generates no signal pulses for the detection signal if the timingoverlap is detected.